Long working distance portable smartphone microscopy for metallic mesh defect detection
Authors: Zhengang LU, Hongsheng QIN, Jing LI, Ming SUN, Jiubin TAN
Metallic mesh is a transparent electromagnetic shielding film with a fine metal line structure. However, in production preparation or actual use it can develop defects that affect the optoelectronic performance. The development of in situ non-destructive testing (NDT) devices for metallic mesh requires long working distances, reflective optical path design, and miniaturization. To address the limitations of existing smartphone microscopes, which feature short working distances and inadequate transmi