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Prof. YANG Xiaohong

School of Mechanical Engineering, Jiangsu University of Technology, Changzhou 213001, Jiangsu, China

Research Publications & English Decoded Briefs

Showing 2 publications
Surface Technology (表面技术)2026DOI: 10.16490/j.cnki.issn.1001-3660.2026.10.011

Laser-ablated PDMS/Copper Powder Superhydrophobic Copper Surfaces for Enhanced Condensation Heat Transfer

Conventional polydimethylsiloxane (PDMS) coatings for condensation heat transfer suffer from insufficient mechanical durability and high interfacial thermal resistance, limiting their industrial deployment. This study introduces a one-step, fluorine-free infrared nanosecond laser ablation strategy to fabricate superhydrophobic copper surfaces with integrated thermal conductivity. An H62 brass substrate was pre-coated with a PDMS/copper powder mixture and directly ablated in air. Orthogonal optimization identified scan spacing 200 μm, 20 passes, scan speed 150 mm/s, and PDMS:Cu mass ratio 2:1 as optimal. The resulting surface (SHS-Cu) exhibited a hierarchical micro/nanostructure with coral-reef-like micro-skeletons and nano-flocculent features, achieving a water contact angle (WCA) of 158.4° and sliding angle (WSA) of 6°. Mechanical stability tests showed WCA of 149° after 45 sandpaper abrasion cycles and 147.7° after 240 g sand impact. Thermal stability at 300 °C for 12 h maintained WCA >151.8° and WSA <9°. Continuous steam exposure for over 9 h preserved superhydrophobicity (WCA >151.4°), with full recovery after 100 °C heat treatment for 2 h. Condensation heat transfer coefficient (HTC) at ΔT = 1 K reached 2.12 times that of smooth copper for pure PDMS, and 5.85 times for the composite coating (2.76 times that of pure PDMS). The copper powder network reduces interfacial thermal resistance, synergizing with dropwise condensation. This method offers a scalable, environmentally benign route for high-performance condensation surfaces.

Journal of Semiconductors (半导体学报 - 中国科学院半导体研究所)2025DOI: 10.1088/1674-4926/25020025

Mesa-structured AlGaAsSb APD: dark current and noise analysis

Avalanche photodiode (APD) is a kind of photodetector with important applications in optical communication, light detection and ranging (LIDAR) and other fields. APDs fabricated using the recently developed AlGaAsSb as the multiplication material exhibit excellent noise performance. In this work, we report a low-noise separate absorption, grading, charge, and multiplication (SAGCM) InGaAs/AlGaAsSb APD operating at 1550 nm. A double-mesa structure was fabricated to reduce the dark current. Numerical simulations were conducted to compare two different mesa-structured APDs. By analyzing the electric field distribution, it was found that the electric field at the edge of the multiplication region in the double-mesa APD is nearly 100 kV/cm lower than that of the single-mesa structure. Experimental results demonstrate that after device punch-through, the double-mesa APD’s dark current can be reduced by up to four times compared to the single-mesa APD. Quantitative analysis of the dark current components in the AlGaAsSb APD further confirms that the low sidewall electric field in the double-mesa structure effectively suppresses the trap-assisted tunneling. Additionally, noise measurements indicate a k-value of approximately 0.014, which is significantly lower than that of traditional multiplication materials. This work provides preliminary validation for further performance improvements in low noise and low dark current AlGaAsSb APDs.