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Mesa-structured AlGaAsSb APD: dark current and noise analysis

Authors: Yuhang He; Rui Wang; Yan Liang; Yingqiang Xu; Guowei Wang; Haiqiao Ni; Shuo Wang; Zhichuan Niu; Xiaohong Yang

DOI: 10.1088/1674-4926/25020025Status: Verified Translated Edition
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Key Findings in This Report

• A low-noise SAGCM InGaAs/AlGaAsSb APD operating at 1550 nm was successfully fabricated with a double-mesa structure. • The double-mesa structure reduces the electric field at the multiplication region edge by nearly 100 kV/cm compared to single-mesa, suppressing trap-assisted tunneling and reducing dark current by up to four times. • The AlGaAsSb APD exhibits an exceptionally low excess noise factor with a k-value of approximately 0.014, outperforming traditional multiplication materials. • This work validates the potential of AlGaAsSb APDs for achieving both low dark current and low noise, promising for applications in optical communication and LIDAR.
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