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Official PDF TranslationChinese Journal of Mechanical Engineering

Research Progress of Microstructure Regulation on the Electrical Properties of PZT Ferroelectric Films

Authors: Hefa Zhu; Zhiguo Xing; Haidou Wang; Longlong Zhou; Wei Peng; Qingbo Mi; Han Dong; Weiling Guo

DOI: 10.1186/s10033-025-01303-wStatus: Verified Translated Edition
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Key Findings in This Report

• Microstructural parameters such as thickness, porosity, Zr/Ti ratio, doping, grain size, grain boundaries, and orientation critically influence the dielectric, ferroelectric, and piezoelectric properties of PZT ferroelectric films. • Geometric structure (thickness and porosity) directly impacts electrical performance, with application-specific requirements dictating optimal dimensions and porosity. • Compositional adjustments (Zr/Ti ratio and doping) alter phase composition, thereby tuning ferroelectric and piezoelectric responses. • Grain structure (size, boundaries, orientation) affects domain dynamics and switching behavior, offering pathways for performance optimization in device design.
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