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Radiation hardness of 1.2 kV SiC power devices with advanced edge termination structures under proton irradiation

Authors: Sangyeob Kim; Jeongtae Kim; Dong-Seok Kim; Hyuncheol Bae; Min-Woo Ha; Ogyun Seok

DOI: 10.1088/1674-4926/25040023Status: Verified Translated Edition
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Key Findings in This Report

• RA-JTE edge termination shows less than 1% breakdown voltage variation under 45 MeV proton irradiation up to 1×10^14 cm^-2, demonstrating superior radiation hardness. • MFZ-JTE and FLR structures exhibit breakdown voltage shifts of 6.1% and 15.2% respectively at the highest fluence, indicating higher susceptibility to TID effects. • TCAD simulations corroborate experimental findings, attributing RA-JTE's robustness to effective electric field redistribution by multiple P+ rings. • The study provides practical design guidance for radiation-hardened SiC power devices intended for space and high-radiation environments.
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