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Radiation-hardened Pipeline in Microcontroller Core

Authors: XUE Haiwei; LI Xinqiang; WANG Jinxiang; FU Fangfa

DOI: 10.7538/yzk.2025.youxian.0385Status: Verified Translated Edition
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Key Findings in This Report

• A lockstep-based pipeline hardening technique for a 32-bit MCU core reduces soft error rates in critical modules (PFU, DPU, Cache AXIM) from 40.07%, 26.36%, and 27.29% to 0%, 0.69%, and 1.11%, respectively. • The proposed method achieves a 69.68% resource utilization compared to triple modular redundancy (TMR), significantly reducing FPGA area overhead. • Recovery time is improved by 26.2% over software checkpoint roll-back, with average recovery cycles of 26,922.5 versus 36,479.06. • The combined hardware-software approach effectively mitigates single-event upsets (SEUs) in microcontroller pipelines, enhancing fault tolerance for space applications.