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A distributed static model of capacitive MEMS microwave power detection chip

Authors: Ruifeng Li; Debo Wang

DOI: 10.1088/1674-4926/25100007Status: Verified Translated Edition
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Key Findings in This Report

• A distributed static model based on the deflection equation improves prediction accuracy of static mechanical quantities in MEMS cantilever beams for microwave power detection chips. • The pull-in voltage increases with the gap but decreases with the length, with a relative error of only 6.5% compared to simulation, outperforming other models. • Measured return loss varies between −66.46 and −10.56 dB over 8−12 GHz, showing a V-shaped trend; measured sensitivity of 66.5 fF/W closely matches theoretical 69.3 fF/W (5.6% error). • The distributed model provides superior accuracy and physical realism, offering important reference for microwave power detection chip design.