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Transport mechanism of oxide-based programmable diode

Authors: Junru Qu; Wentai Xia; Jifang Cao; Xueyang Li; Ran Cheng; Dong Liu; Bing Chen

DOI: 10.1088/1674-4926/25090006Status: Verified Translated Edition
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Key Findings in This Report

• Oxide-based programmable diodes with TiN/HfO2/Si/Al structure exhibit stable diode-like I-V characteristics in low-resistance state. • Conduction and rectification are controlled by the interface between the oxygen vacancy filament and the semiconductor electrode. • First-principle simulations reveal the local density of states and band bending, explaining the transport mechanisms. • Electron transport is dominated by Poole-Frenkel emission under forward bias and reverse Schottky-diode behavior under negative bias.