Enhanced low dose rate sensitivity and pre-irradiation elevated-temperature stress effects in bipolar devices: role of hydrogen in the passivation layer

• Ultra-low dose rate irradiation (0.002 rad(Si)/s) can cause more than three times greater degradation than common low dose rate (0.01 rad(Si)/s) in some bipolar devices. • Pre-irradiation elevated-temperature stress (PETS) can enhance radiation sensitivity by a factor up to 20.3. • Devices exhibiting PETS effects have a saturation dose rate for ELDRS below 0.01 rad(Si)/s. • The type and concentration of hydrogen bonds in the passivation layer are key factors influencing ELDRS and PETS effects.