Official PDF Translation•Academic Research Journal

Dynamic avalanche reliability enhancement of FS-IGBT under unclamped inductive switching

Authors: Jingping Zhang; Houcai Luo; Huan Wu; Bofeng Zheng; Xianping Chen

DOI: 10.1088/1674-4926/25020006Status: Verified Translated Edition

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Key Findings in This Report

• Comprehensive investigation of dynamic avalanche in FS-IGBT under UIS with varying circuit parameters. • Identification of gate voltage, load inductance, and temperature as key factors influencing avalanche reliability. • Proposal of a circuit parameter optimization method to enhance dynamic avalanche capability. • Practical guidelines: reduce gate voltage, increase load inductance, and lower temperature for improved reliability.